JPH0416734B2 - - Google Patents
Info
- Publication number
- JPH0416734B2 JPH0416734B2 JP28170188A JP28170188A JPH0416734B2 JP H0416734 B2 JPH0416734 B2 JP H0416734B2 JP 28170188 A JP28170188 A JP 28170188A JP 28170188 A JP28170188 A JP 28170188A JP H0416734 B2 JPH0416734 B2 JP H0416734B2
- Authority
- JP
- Japan
- Prior art keywords
- operating force
- measuring
- measurement
- detection mechanism
- stroke
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 55
- 238000001514 detection method Methods 0.000 claims description 34
- 238000012360 testing method Methods 0.000 claims description 34
- 239000000523 sample Substances 0.000 description 11
- 238000000034 method Methods 0.000 description 9
- 238000004891 communication Methods 0.000 description 5
- 238000012937 correction Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 238000012544 monitoring process Methods 0.000 description 5
- 238000007796 conventional method Methods 0.000 description 3
- 230000003321 amplification Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 230000002950 deficient Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
Landscapes
- Force Measurement Appropriate To Specific Purposes (AREA)
- Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
- Push-Button Switches (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP28170188A JPH02128137A (ja) | 1988-11-07 | 1988-11-07 | スイッチ操作力特性試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP28170188A JPH02128137A (ja) | 1988-11-07 | 1988-11-07 | スイッチ操作力特性試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02128137A JPH02128137A (ja) | 1990-05-16 |
| JPH0416734B2 true JPH0416734B2 (en]) | 1992-03-25 |
Family
ID=17642775
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP28170188A Granted JPH02128137A (ja) | 1988-11-07 | 1988-11-07 | スイッチ操作力特性試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02128137A (en]) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4429681A1 (de) * | 1994-08-22 | 1996-02-29 | S & B Technologie Schaetzle & | Prüfeinrichtung für Geräteschalter |
| JP5480648B2 (ja) * | 2010-01-26 | 2014-04-23 | 日本航空電子工業株式会社 | 操作感触測定装置及び操作感触測定方法 |
| CN103760885A (zh) * | 2013-11-12 | 2014-04-30 | 江苏春兰动力制造有限公司 | 一种螺杆式水冷冷水/热泵机组电气模拟测试台 |
| EP4151973A1 (de) * | 2021-09-20 | 2023-03-22 | Kistler Holding AG | Vorrichtung zur prüfung mindestens eines steckelements |
-
1988
- 1988-11-07 JP JP28170188A patent/JPH02128137A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH02128137A (ja) | 1990-05-16 |
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